NASA HAS IDENTIFIED FREEFORM OPTICS AS AN INTEGRAL PART OF THEIR FUTURE OPTICAL SYSTEMS. REDUCING THE COST OF FREEFORMS WILL BE CRUCIAL IN ACCELERATING THE INTEGRATION OF FREEFORMS INTO COST-SENSITIVE NASA OPTICAL SYSTEMS. ONE METHOD TO REDUCE COST IS TO REDUCE THE METROLOGY TIME NEEDED TO CHARACTERIZE THE FREEFORMS. THIS IS ESPECIALLY TRUE WHEN MEASURING THE MID-SPATIAL FREQUENCY ERRORS INDUCED DURING THE MANUFACTURING PROCESS. CURRENT METHODS ARE TACTILE MEASUREMENT DEVICES SUCH AS A COORDINATE MEASUREMENT MACHINE AND PROFILOMETERS. THESE METROLOGY METHODS SLOW THE MANUFACTURING PROCESS AND THEREFORE INCREASE COST. THE GOAL OF THIS NASA PHASE 1 SBIR IS TO DEVELOP AND INVESTIGATE A UNIQUE DEFLECTOMETRY ENCLOSURE TO IMPROVE EFFICIENCY OF THE MANUFACTURING OF FREEFORM OPTICS. THIS PROPOSED INNOVATION IS A MULTI-CAMERA MULTI-MONITOR DEFLECTOMETRY SYSTEM THAT CAN BE INTEGRATED INTO MANUFACTURING. IT WOULD INCREASE EFFICIENCY OF THE FREEFORM MANUFACTURING PROCESS BY GREATLY REDUCING THE TIME TO MEASURE THE MID-SPATIAL FREQUENCY ERRORS OF THE FREEFORM PART AND THEREFORE WOULD REDUCE THE TIME AND COST OF FREEFORM MANUFACTURING.