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Federal Contract Awards

42awards

Analyze awards, watch incumbents and competitors, track new transactions or changes, and use award history to shape recompete and capture strategy.

Awardee
is
XJDBN7AV1GG3
Award ID
Description
Recipient
Total Value
Awarding Agency
Funding Agency
Set Aside
NAICS
PSC
Award Date
Start Date
End Date
N0016425PG601
TRION PHANTOM III ETCH SYSTEM MAINTENANCETRION TECHNOLOGY INC$29,543DEPT OF THE NAVYWASHINGTON HEADQUARTERS SERVICES (WHS)—811210Electronic and Precision Equipment Repair and MaintenanceJ066MAINT/REPAIR/REBUILD OF EQUIPMENT- INSTRUMENTS AND LABORATORY EQUIPMENTJul 3, 2025Jul 3, 2025Apr 23, 2026
HQ072723P0037
PREVENTATIVE MAINTENANCE FOR PHANTOM IITRION TECHNOLOGY INC$77,500DEFENSE MICROELECTRONICS ACTIVITY (DMEA)DEFENSE MICROELECTRONICS ACTIVITY (DMEA)—334515Instrument Manufacturing for Measuring and Testing Electricity and Electrical SignalsJ066MAINT/REPAIR/REBUILD OF EQUIPMENT- INSTRUMENTS AND LABORATORY EQUIPMENTSep 7, 2023Sep 7, 2023Sep 17, 2028
80NSSC22PA316
PREVENTATIVE MAINTENANCE FOR TRION ETCH SYSTEMS IN THE DDLTRION TECHNOLOGY INC$20,000NATIONAL AERONAUTICS AND SPACE ADMINISTRATIONNATIONAL AERONAUTICS AND SPACE ADMINISTRATION—334516Analytical Laboratory Instrument ManufacturingK099MODIFICATION OF EQUIPMENT- MISCELLANEOUSFeb 24, 2022Feb 24, 2022Feb 24, 2024
80NSSC19P2370
MAINTENANCE PARTS AND LABOR (PREVENTATIVE MAINTENANCE)TRION TECHNOLOGY INC$27,230NATIONAL AERONAUTICS AND SPACE ADMINISTRATIONNATIONAL AERONAUTICS AND SPACE ADMINISTRATION—334516Analytical Laboratory Instrument ManufacturingJ099Sep 30, 2019Sep 30, 2019Sep 29, 2021
HQ072718P0033
PM FOR PHANTOM II AND PHANTOM II MINI-LOCKTRION TECHNOLOGY INC$159,817DEFENSE MICROELECTRONICS ACTIVITY (DMEA)DEFENSE MICROELECTRONICS ACTIVITY (DMEA)—334516Analytical Laboratory Instrument ManufacturingJ066MAINT/REPAIR/REBUILD OF EQUIPMENT- INSTRUMENTS AND LABORATORY EQUIPMENTAug 9, 2018Aug 9, 2018Sep 17, 2023
W31P4Q18P0061
TRION PHANTOM III REACTIVE ION ETCH SYSTEM FOR THE PROTECTION TECHNOLOGY LABORATORY.TRION TECHNOLOGY INC$345,100DEPT OF THE ARMYDEPT OF THE ARMY—333242Semiconductor Machinery Manufacturing3695MISCELLANEOUS SPECIAL INDUSTRY MACHINERYMar 13, 2018Mar 13, 2018Sep 10, 2018
N6227117P1230
IGF::OT::IGFTRION TECHNOLOGY INC$61,110DEPT OF THE NAVYDEPT OF THE NAVY—334516Analytical Laboratory Instrument ManufacturingJ066MAINT/REPAIR/REBUILD OF EQUIPMENT- INSTRUMENTS AND LABORATORY EQUIPMENTAug 4, 2017Sep 18, 2017Sep 17, 2022
W31P4Q16P0141
UPGRADE TO TRION CHLORINE SYSTEMTRION TECHNOLOGY INC$15,526DEPT OF THE ARMYDEPT OF THE ARMY—334516Analytical Laboratory Instrument Manufacturing6695COMBINATION AND MISCELLANEOUS INSTRUMENTSSep 21, 2016Sep 21, 2016Dec 15, 2016
NNG16LD43P
SOFTWARE-WINDOWS 7 DISKS, ALONG WITH THE REQUIRED DRIVERS. INCLUDE LABOR AND TRAVEL.TRION TECHNOLOGY INC$6,077NATIONAL AERONAUTICS AND SPACE ADMINISTRATIONNATIONAL AERONAUTICS AND SPACE ADMINISTRATION—334413Semiconductor and Related Device Manufacturing7030Aug 25, 2016Aug 25, 2016Feb 15, 2017
N6227114M1244
ANNUAL MAINTENANCE FOR A SIRUS T2 REACTIVE ION ETCHERTRION TECHNOLOGY INC$36,666DEPT OF THE NAVYDEPT OF THE NAVY—334516Analytical Laboratory Instrument ManufacturingJ066MAINT/REPAIR/REBUILD OF EQUIPMENT- INSTRUMENTS AND LABORATORY EQUIPMENTSep 18, 2014Sep 18, 2014Sep 17, 2017
W31P4Q14P0322
MAINTENANCE AGREEMENT FOR A TRION TECHNOLOGY PLASMA ICP ETCHING SYSTEM, WITH AN OPTION FOR AN ADDITIONAL YEAR OF COVERAGE.TRION TECHNOLOGY INC$60,462DEPT OF THE ARMYDEPT OF THE ARMY—811219J066MAINT/REPAIR/REBUILD OF EQUIPMENT- INSTRUMENTS AND LABORATORY EQUIPMENTAug 29, 2014Aug 29, 2014Aug 31, 2016
HQ072714P1420
IGF::OT::IGF PLASMA ETCHER ONSITE REFURBISHMENTTRION TECHNOLOGY INC$108,719DEFENSE MICROELECTRONICS ACTIVITY (DMEA)DEFENSE MICROELECTRONICS ACTIVITY (DMEA)—811219J066MAINT/REPAIR/REBUILD OF EQUIPMENT- INSTRUMENTS AND LABORATORY EQUIPMENTApr 14, 2014Apr 10, 2014Aug 21, 2016
W31P4Q13P0213
PROCUREMENT OF ANNUAL MAINTENANCE CONTRACT FOR LABORATORY PLASMA ETCHER SYSTEM, LOCATED IN BLDG 7804 - REDSTONE ARSENAL.TRION TECHNOLOGY INC$0DEFENSE CONTRACT MANAGEMENT AGENCY (DCMA)DEPT OF THE ARMY—334516Analytical Laboratory Instrument ManufacturingJ066MAINT/REPAIR/REBUILD OF EQUIPMENT- INSTRUMENTS AND LABORATORY EQUIPMENTAug 26, 2013Aug 26, 2013Aug 31, 2014
NNG13LC38P
IGF::OT::IGF FUNDS FOR MAINTENANCE SERVICE FOR A TRION ETCHER; INCLUDING PARTS AND LABOR FOR 12 MONTHS.TRION TECHNOLOGY INC$111,760NATIONAL AERONAUTICS AND SPACE ADMINISTRATIONNATIONAL AERONAUTICS AND SPACE ADMINISTRATION—334413Semiconductor and Related Device ManufacturingJ066MAINT/REPAIR/REBUILD OF EQUIPMENT- INSTRUMENTS AND LABORATORY EQUIPMENTJul 25, 2013Jul 25, 2013Jul 4, 2018
FA940113C0006
INDUCTIVELY COUPLED PLASMA REACTIVE IONTRION TECHNOLOGY INC$323,850DEPT OF THE AIR FORCEDEPT OF THE AIR FORCE—334413Semiconductor and Related Device Manufacturing6640LABORATORY EQUIPMENT AND SUPPLIESJan 15, 2013Jan 18, 2013Feb 15, 2014
FA860112C0296
PECVD SYSTEMTRION TECHNOLOGY INC$315,875DEPT OF THE AIR FORCEDEPT OF THE AIR FORCE—3332956640LABORATORY EQUIPMENT AND SUPPLIESSep 20, 2012Sep 20, 2012Mar 29, 2013
NNG12LN54P
IGF::OT::IGF OTHER FUNCTIONS. MAINTENANCE AGREEMENT FOR TRION CHLORINE REACTIVE ION ETCHER (RIE). SYSTEM REQUIRES PREVENTIVE MAINTENANCE, REPAIR, AND PERIODIC UPGRADES BY A QUALIFIED ENGINEER ON A REGULAR BASIS.TRION TECHNOLOGY INC$22,352NATIONAL AERONAUTICS AND SPACE ADMINISTRATIONNATIONAL AERONAUTICS AND SPACE ADMINISTRATION—333295J099Jul 6, 2012Jul 5, 2012Jul 4, 2013
FA860112P0024
OPTION FOR TRION PHANTOMTRION TECHNOLOGY INC$108,000DEPT OF THE AIR FORCEDEPT OF THE AIR FORCE—3332956625ELECTRICAL AND ELECTRONIC PROPERTIES MEASURING AND TESTING INSTRUMENTSNov 29, 2011Nov 29, 2011Feb 21, 2012
W9124P11P0339
TRION PHANTOM III REACTIVE ION ETCH SYSTEM WITH PFEIFFER TURBO PUMPTRION TECHNOLOGY INC$151,750DEPT OF THE ARMYDEPT OF THE ARMY—3332956640LABORATORY EQUIPMENT AND SUPPLIESSep 7, 2011Sep 6, 2011Nov 29, 2011
NNG11LC09P
SERVICE MAINTENANCE CONTRACT FOR TRION ETCHER SYSTEMTRION TECHNOLOGY INC$22,352NATIONAL AERONAUTICS AND SPACE ADMINISTRATIONNATIONAL AERONAUTICS AND SPACE ADMINISTRATION—333295J099Jul 19, 2011Feb 18, 2011Feb 17, 2012
W31P4Q11P0048
PLASMA ETCHER SYSTEM (PHANTOM III RIE ETCH SYSTEM)TRION TECHNOLOGY INC$338,900DEPT OF THE ARMYDEPT OF THE ARMY—332721Precision Turned Product Manufacturing6640LABORATORY EQUIPMENT AND SUPPLIESFeb 25, 2011Feb 25, 2011Jun 14, 2011
NNG11CR25C
NASA GODDARD SPACE FLIGHT CENTER'S (GSFC) DETECTOR DEVELOPMENT LABORATORY (DDL) PRODUCES MULTILAYER CIRCUITS ON FOUR INCH AND SIX INCH SILICON WAFERS FOR TECHNOLOGY DEMONSTRATIONS AND FLIGHT HARDWARE OF DETECTOR FOCAL PLANES AND OTHER COMPONENTS. AN ESSENTIAL TOOL REQUIRED TO BUILD THESE CIRCUITS IS A REACTIVE ION ETCHER (RIE) THAT CAN CHEMICALLY ETCH THIN METAL AND DIELECTRIC FILMS ON PLANAR SUBSTRATES. THE DDL AT GSFC POSSESSES SEVERAL SUCH TOOLS AND HAS DEDICATED THEM TO SPECIFIC PROCESSES TO MAINTAIN INTEGRITY OF THE SPECIFIC PROCESS AND TO PREVENT CROSS-CONTAMINATION OF SUBSTRATES DUE TO PROCESSES THAT ARE INCOMPATIBLE. THESE INCLUDE TOOLS DEDICATED TO INDIUM, GAAS, AND DIELECTRIC MEMBRANES. OTHER PROCESSES HAVE BEEN PERFORMED IN A SINGLE, COMMON-USE, NON-LOAD-LOCKED RIE REGARDLESS OF PROCESS COMPATIBILITY OR CAPABILITY OF THE TOOL. BECAUSE NASA PROJECTS ARE MOVING FROM PROTOTYPING TO PRODUCTION OF CERTAIN DETECTOR FOCAL PLANES, THE DDL NOW REQUIRES A LOAD-LOCKED R1E TO DEDICATE TO ETCHING OF SPECIFIC METALS. RECENTLY, THE DDL HAS BEGUN TO REQUIRE HIGHLY REPRODUCIBLE ETCHES FOR SUPERCONDUCTING MICROSTRIPLINE CIRCUITS WHICH INCLUDE ETCHES OF NIOBIUM AND MOLYBDENUM AS WELL AS VAPOR DEPOSITED SILICON OXIDE. THESE ETCHES REQUIRE CAREFUL CONTROL OF SIDEWALL PROFILES, GOOD SELECTIVITY OF THE TARGET MATERIAL TO HOTORESIST, HIGHLY UNIFORM ETCH RATES ACROSS THE FULL AREA OF THE SUBSTRATE, AND SENSITIVE END POINT DETECTION. FURTHER, TO MAINTAIN THE REPRODUCIBILITY OF THE RECIPES IN THE RIE, THE VACUUM CHAMBER WHERE THE ETCHING TAKES PLACE MUST HAVE HIGHLY REPRODUCIBLE VACUUM CONDITIONS (LOW WATER CONTENT, LOW BASE PRESSURE). A VACUUM-PUMPED LOAD LOCK WILL ALSO BE SPECIFIED TO ACHIEVE THE REQUIRED CHAMBER CONDITIONS. THE RIE TOOL WILL NEED TO SUPPORT ONLY FLUORINE CHEMISTRY AND HAVE FULLY SEALED SYSTEM SUITABLE FOR HANDLING OF CORROSIVE GASES AND RIE BIPRODUCTS. THE OBJECTIVE OF THIS PROJECT IS TO PROCURE A LOAD-LOCKED REACTIVE ION ETCHER SUITABLE FOR ETCHING THIN FILMS OF NIOBIUM AND MOLYBDENUM ON FOUR INCH AND SIX INCH SUBSTRATES TO BE INSTALLED IN THE NASA GSFC DDL. NO PROTOTYPES, OR ONE-OF-A-KIND SYSTEMS WILL BE CONSIDERED. THE UNIT MUST BE A PRODUCTION MODEL WITH AT LEAST 5 SIMILAR UNITS WORKING IN THE FIELD. THE SYSTEM MUST HAVE A VACUUM LOADLOCK FOR LOADING/UNLOADING WAFERS INTO THE PROCESS CHAMBER WITHOUT THE INTRODUCTION OF ATMOSPHERE. THE LOADLOCK MUST HE EQUIPPED WITH A LOAD ARM FOR TRANSFER OF WAFERS BETWEEN THE LOADLOCK AND PROCESS CHAMBERS WHILE UNDER VACUUM. THE EQUIPMENT MUST HAVE A SMALL FOOTPRINT, UTILIZING NO MORE THAN 4 FEET BY 5 FEET OF FLOOR SPACE FOR THE MAIN SYSTEM AND COMPUTER CONTROLLER. (WATER CHILLER NOT INCLUDED IN THIS FOOTPRINT.) THE SYSTEM MUST BE CLASS 10 CLEANROOM COMPATIBLE. ALL OBJECTS WITHIN THE PROCESS CHAMBER THAT ARE EXPOSED TO THE PROCESS PLASMA MUST BE CHEMICALLY RESISTANT TO FLUORINE AND OXYGEN ETCHING PLASMAS. ALL GAS LINES MUST BE HIGH PURITY STAINLESS STEEL WITH WELDED VCR FITTINGS. THE SCOPE OF THIS WORK INCLUDES PRODUCTION AND DELIVERY OF A LOAD-LOCKED REACTIVE ION ETCHER TO THE GSFC DDL. THIS INCLUDES THE FOLLOWING: A) DESIGN OF THE RIE SYSTEM AT THE VENDOR LOCATION, B) APPROVAL OF THE DESIGN BY THE GSFC TECHNICAL REPRESENTATIVE. COMMUNICATING REQUIREMENTS TO GSFC FOR INSTALLATION INCLUDING ELECTRICAL POWER NEEDS, GASES AND WATER. C) CONSTRUCTION OF THE RIE AT THE VENDOR FACILITY, D) TESTING OF THE RIE AT THE VENDOR FACILITY INCLUDING ETCHING TEST PARTS PROVIDED BY GSFC TECHNICAL REPRESENTATIVE E) SHIPPING THE UNIT TO GSFC WHERE GSFC PERSONNEL WILL INSTALL IT IN THE DDL F) DEMONSTRATION OF THE RIE AND TRAINING OF GSFC PERSONNEL BY VENDORTRION TECHNOLOGY INC$232,655NATIONAL AERONAUTICS AND SPACE ADMINISTRATIONNATIONAL AERONAUTICS AND SPACE ADMINISTRATION—3332955962MICROCIRCUITS, ELECTRONICFeb 10, 2011Feb 14, 2011May 14, 2012
FA860111P0189
REACTIVE-ION ETCHING SYSTEM (R.I.E.)TRION TECHNOLOGY INC$149,900DEPT OF THE AIR FORCEDEPT OF THE AIR FORCE—3332953695MISCELLANEOUS SPECIAL INDUSTRY MACHINERYFeb 3, 2011Feb 3, 2011Jul 29, 2011
N0024410P1274
TABLE TOP REACTIVE ION ETCHER (RIE)TRION TECHNOLOGY INC$0DEPT OF THE NAVYDEPT OF THE NAVY—3332955961SEMICONDUCTOR DEVICES AND ASSOCIATED HARDWAREJul 16, 2010Jul 14, 2010Oct 6, 2010
NNG09LN51P
INDUCTIVELY COUPLED PLASMA CHLORINE ETCH SYSTEMTRION TECHNOLOGY INC$0NATIONAL AERONAUTICS AND SPACE ADMINISTRATION——3332956640LABORATORY EQUIPMENT AND SUPPLIESJun 10, 2009Jun 10, 2009Sep 4, 2009
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