No attachments available.
Focused Ion Beam/Scanning Electron Microscope (FIB/SEM)
Contact and place of performance
Nina Lin
MD 20899
USA
https://api.sam.gov/prod/opportunities/v1/noticedesc?noticeid=dd96e5e5b43342f2a8c8899af4e24d7b
The National Institute of Standards and Technology issued an award notice on April 6, 2026, for a Focused Ion Beam/Scanning Electron Microscope (FIB/SEM) under solicitation number 1333ND26PNB030039. The procurement is classified under NAICS 334516 Analytical Laboratory Instrument Manufacturing and PSC 5961 SEMICONDUCTOR DEVICES AND ASSOCIATED HARDWARE. There was no set-aside used for this action, designated as set-aside acronym/code NONE.
The equipment is destined for performance in Maryland, USA. Nina Lin is the designated point of contact for this award, which was finalized with zero associated attachments at the time of publication. The acquisition provides specialized laboratory instrumentation to support agency operations within the semiconductor and analytical manufacturing sectors.
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